新設備可以在任何環境下實現安全準確的可靠測量

NEWS RELEASE – Aug. 15, 2006 – National Instruments today announced 12 new isolated M and S Series multifunction data acquisition (DAQ) devices. These devices combine the safety of isolation with the high-performance timing, amplification and calibration technologies of existing M Series DAQ devices for increased accuracy. Built-in isolation increases the safety of data acquisition devices and eliminates common problems that can ruin measurement accuracy. The new multifunction devices offer 16-bit accuracy, 250 kS/s sampling rates, ±10 V or ±20 mA analog inputs, ±10 V or 0-20 mA analog outputs and 5 V TTL/CMOS or 24 V digital inputs and outputs.

8月15日消息——美國國家儀器公司今天發布了12款隔離式M系列和S系列的多功能數據采集（DAQ）設備。這些設備結合了隔離安全性以及現有M系列DAQ設備的高性能調速、放大和校準技術，提高了精確度。內置隔離作用提高了數據采集設備的安全性，消除了可以破壞測量精確度的普通問題。新的多功能設備提供了16位的精確度，250 kS/s的取樣率，±10 V 或者 ±20 mA的模擬輸入，±10 V 或者 0-20 mA的模擬輸出，以及5 V TTL/CMOS 或者 24 V的數字輸入和輸出。

The new isolated M and S Series devices offer channel-to-channel or bank isolation with 1,950 VDC/1,400 Vrms transient withstand for 5 s to a PCI bus, which protects expensive equipment, the user and data from hazardous voltage spikes, transient signals and electrical noise. Isolation works by electrically separating the circuit’s front end, where hazardous voltages can exist, from the rest of the data acquisition system. Isolation is especially important when taking measurements from sensors in the proximity of wall power, large motors, high-voltage switches or other high-voltage lines.

新款隔離式M系列和S系列設備提供了通道至通道或者柵隔離，對一個PCI現場儀器具有5秒的1,950 VDC/1,400 Vrms 瞬時承受力，保護昂貴設備、使用者和數據免受到危險電壓尖脈沖、瞬時信號以及電噪的損害。隔離通過從數據采集系統的其它地方將存在危險電壓的電路前端電力地分離而起作用。隔離作用在測量靠近墻驅動、大型電機、高壓開關或者其它高壓線路的傳感器時就尤其重要。

Isolated M and S Series devices also reject common-mode voltages and prevent ground loops from forming, eliminating two common problems for data acquisition system users. High common-mode voltages can make it impossible to measure the signal in a non-isolated data acquisition system and can even damage the system. The new isolated M and S Series devices can measure from sensors with the signal plus common-mode voltages of up to 60 V. Ground loops, which occur when there is a difference between the ground voltages of the measurement system and the signal being measured, can result in high currents flowing between the two grounds and can damage equipment and ruin accuracy.

隔離式的M系列和S系列設備還可以抵制普通模式的電壓，避免了接地環路的生成，為數據系統使用者排除了兩個普遍問題。普通模式高壓可以導致不能在一個非隔離式數據采集系統中測量信號，甚至會損壞系統。新型的隔離式M系列和S系列設備可以測量傳感器的信號以及高達60V的普通模式電壓。因測量系統和所測量的信號之間的地壓差異而產生的接地環路可以導致兩點間的高電流流動，從而損壞設備和破壞精確度。

Isolated M Series devices integrate seamlessly with the National Instruments LabVIEW graphical development platform, and users can configure the devices using NI measurement and services software.

隔離式M系列設備與國家儀器的LabVIEW 繪圖開發平臺無縫整合，而且使用者可以利用國家儀器的測量和服務軟件配置設備。

About NI Data Acquisition

關于NI數據采集

By integrating commercially available silicon and bus technologies with innovative designs, NI data acquisition (DAQ) products continue to improve measurement speed and accuracy while reducing cost for engineers and scientists. NI data acquisition devices are available on the most widely used buses, including PCI, PXI, PCI Express and USB, and work with the industry’s most popular operating systems such as Windows, Linux and Mac OS X.

通過整合適用于商業的硅技術和現場技術以及創新的設計，NI 數據采集產品繼續提高著測量速度和精確度，同時減少工程師和科學家的成本。NI的數據采集設備適用于最廣泛的應用現場設備，包括PCI， PXI，PCI Express 和 USB，以及可以工作于例如Windows， Linux 和 Mac OS X 等最流行的操作系統。

（本文由中華工控網翻譯，轉載請注明出處，更多中英對照資料請進異域來風http://world.gkong.com）